Miniseminar ved IMT - Bildeanalyse som verktøy i kvalitetsvurdering av korn

Ole Mathis Opstad Kruse

I anledning av at faggruppen for bildeanalyse ved IMT får besøk fra Universitet i Milano, arrangeres det i samarbeid med IPM et miniseminar om "Bildeanalyse som verktøy i kvalitetsvurdering av korn." Seminaret gjennomføres ved IMT mandag 14. juni.

Seminaret vil finne sted i auditorium TF145 ved IMT mandag 14. juni. Seminaret vil foregå på engelsk!
Alle er hjertelig velkommen til å delta på hele eller deler av seminaret, for spørsmål ta kontakt med Knut Kvaal, tlf 6496 5394. Det er ingen påmelding, men om du ønsker lunsj, skriv en epost til Knut Kvaal.

Program

10.15	Anne Kjersti Uhlen Knut Kvaal	Welcome
10.20	Professor Anne Kjersti Uhlen, IPM	Wheat Production and Quality Research in Norway [pdf]
10.40	Dr. Manuela Mariotti, University of Milan, Italy	Gluten-free pasta: Technology and quality evaluation [pdf]
11.10	Associate Professor Knut Kvaal, IMT	Background of earlier work on image analysis techniques applied to baking quality and new developments of software tools in texture analysis [pdf]
11.30	Post Doc Ulrike Böcker Nofima Mat	Investigations of gluten protein structures by use of FTIR spectroscopy
11.50		Lunch
12.30	PhD stud./Senior Ing. Andreas Flø, IMT	The MIA concept. Multivariate Image Analysis as a tool to monitor texture in cereal mixtures
12.50	PhD stud. Shiori Koga, IPM	Synthesis an ploymerization of gluten proteins in a Nordic climate and impacts for baking quality [pdf]
13:15	PhD stud. Ole Mathis Kruse, IMT	Feature extraction techniques to use in cereal classification [pdf] [ppt]
13.40	Ingenior Lorenzo Fongaro, University of Milan, Italy	Surface texture evaluation by means of traditional and advance image analysis techniques: an application on italian pasta
14.00	Associate Professor Ulf G. Indahl, IMT	Classification techniques [pdf]
14.20	Associate Professor Cecilia Futsaether	Image analysis techniques in monitoring ozone damage on plants [pdf]
14.40	Professor Anne Kjersti Uhlen, IPM	Possible innovations: Analyzing the visual grain quality to meet challenges in the food wheat value chain [pdf]
15.00	PhD stud. Stein Ivar Øvergaard, Bioforsk/IMT	Remote sensing-based prediction of grain yield and quality in wheat
15.20	Associate Professor Knut Kvaal, IMT	Concluding remarks

17.00		If the weather is nice: Garden party

Updated: 15.09.10
Printerfriendly version

Del med en venn:

Department of Mathematical Sciences and Technology

Department of Mathematical Sciences and Technology

Additional information

Imaging group at UMB - www.umb.no/imaging