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Seminar at IMT - Potensials of advanced image analysis technology in the cereal science research
Ole Mathis Opstad KruseIn connection with a visit from the University of Milan, IMT will with IPM organizing a seminar with the title "Potentials of advanced image analysis technology in cereal science research." The semiar is on Monday June, 14.
The seminar will take place in TF145 at the IMT building monday June, 14. The seminar will be in english.
The seminar is open for everyone. If you want more details, contact Knut Kvaal, 6496 5394. There is no registration, but if you want lunch, send an email to Knut Kvaal.
Program
| 10.15 | Anne Kjersti Uhlen Knut Kvaal | Welcome |
| 10.20 | Professor Anne Kjersti Uhlen, IPM | Wheat Production and Quality Research in Norway [pdf] |
| 10.40 | Dr. Manuela Mariotti, University of Milan, Italy | Gluten-free pasta: Technology and quality evaluation [pdf] |
| 11.10 | Associate Professor Knut Kvaal, IMT | Background of earlier work on image analysis techniques applied to baking quality and new developments of software tools in texture analysis [pdf] |
| 11.30 | Post Doc Ulrike Böcker Nofima Mat | Investigations of gluten protein structures by use of FTIR spectroscopy |
| 11.50 | | Lunch |
| 12.30 | PhD stud./Senior Ing. Andreas Flø, IMT | The MIA concept. Multivariate Image Analysis as a tool to monitor texture in cereal mixtures |
| 12.50 | PhD stud. Shiori Koga, IPM | Synthesis an ploymerization of gluten proteins in a Nordic climate and impacts for baking quality [pdf] |
| 13:15 | PhD stud. Ole Mathis Kruse, IMT | Feature extraction techniques to use in cereal classification [pdf] [ppt] |
| 13.40 | Ingenior Lorenzo Fongaro, University of Milan, Italy | Surface texture evaluation by means of traditional and advance image analysis techniques: an application on italian pasta |
| 14.00 | Associate Professor Ulf G. Indahl, IMT | Classification techniques [pdf] |
| 14.20 | Associate Professor Cecilia Futsaether | Image analysis techniques in monitoring ozone damage on plants [pdf] |
| 14.40 | Professor Anne Kjersti Uhlen, IPM | Possible innovations: Analyzing the visual grain quality to meet challenges in the food wheat value chain [pdf] |
| 15.00 | PhD stud. Stein Ivar Øvergaard, Bioforsk/IMT | Remote sensing-based prediction of grain yield and quality in wheat |
| 15.20 | Associate Professor Knut Kvaal, IMT | Concluding remarks |
| 17.00 | If the weather is nice: Garden party |
Updated: 15.09.10
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